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3d Dimensional 'aD Tool (i) Development

nano (xi'an) Metrology co., Ltd | Updated: Oct 20, 2016
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ghaH ngIm development QeD cham 'ej, increasingly ghoQIjneS law' mIchHom size 'aD 'ej parameter Qap-'ay' tu'lu'bej requirements. DeSDu' SaH naH jajmeymaj law' bIquv methods jan, 'ej 'aD successfully Hach nuv limitation cost, measurement range 'ej accuracy etc., baS vIlopQo' jay' 39 canand ghaj Hoch; QeD cham 'ej development nIS ghom rut. below tool 'aD 'utmo' Dujvam disadvantages 3d je.

wej Contact 'aD

wej cmm

Hach method dimensional contact measurement wej vo' potlhmeyDaq nejwI' Segh. nowadays,'aD machine(cmm) Quv wejsuccessful ghantoH 'elbogh malja' 3d tools 'ej development method. wej Quv 'aD HablI' wej neH 'eblIj multifunctional 'aD jan 'ach 'eblIj jen precision, HoS comprehensive geometric measurement luch. on the basis of precision mIqta', precision jan chut lulajpu'bogh, va cham, De'wI' cham, software cham 'ej jenwI' cham.

generally consists wej Quv 'aD HablI' 'elbogh tlham, 'aD pat, SeH pat.nejwI' pat, jan, De'wI', terminal luch such as printers 'ej displayer 'ej cha'. cha' relationship below.


DubelmoHchugh maHvaD yu' 'ej QuQ vIvoqHa' pagh qeS inform

e-mail:overseas@cmm-nano.com

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