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DuqIppu'chugh cmm motlh Measurement (i) Difference

nano (xi'an) Metrology co., Ltd | Updated: Oct 13, 2016
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ghaH development modern industry, nom 'ej reliable 'aD method qang vaj je poQ tu'lu'bej mechanical 'ay', moj vI'Iprup complicate, requirements.'aD HablI' (cmm) Quv wejje latlh 'eblIj jen nom precision jan 'aD, HeQ jIHMej je wovbe' requirements. vaj widely lo' neH mIqta' manufacturing, jan manufacturing, va industry, Hub aerospace 'ej national industries. especially yuQmeyDaq qIvon, Hegh, precision casting, puH Duj yub, QuQ 'ay' 'aD, porgh je jIHMej je logh ghor 'ay' curved Segh cam 'ej aircraft.

1. geometric size tu'lu'bej 'ej measurement

measurement vum-'ay' geometry size 'ej tu'lu'bej, qeng independently motlh nIS conventional method. especially neH measurement Qap-'ay' tu'lu'bej, Qap-'ay' requirements yu' ghaj 'oH. Huch law' latlh poH law' actual measurement, cost 'oH wIqelchugh HeghDI' planeness tablet 'aD. wej ghor nom lang neH rap 'ab law' tablet lIS nIS maH.

unlike conventional methods, size tu'lu'bej 'ej laH simultaneously 'aD cmm. 'aD object Quv 'aD HablI' quv, vIchID wej je vuDmey tlhopDaq HIjmeH discrete lang. according to 'aD object je requirements pIm vo' vuDmey tlhopDaq puS discrete lang instead of 'aD object, vegh SIm size object tu'lu'bej 'ej qIlmeH pIj mI' 'aD. pa' Qap-'ay' 'aD, wa'DIch paQDI'norgh luchenmoHmeH Hoch nejwI' calibration Qagh moH muHIvtaHbogh choH eliminateenvironmental je. 'ej vaj according to chut lulajpu'bogh basis artifacts mIw benchmark joq, Qap-'ay' Quv pat nej nIS maH. tu'lu' Qap-'ay' clamping requirement pagh lIS, Qap-'ay' pol neH nIS maH ratlh ngaDmoH.


DubelmoHchugh maHvaD yu' 'ej QuQ vIvoqHa' pagh qeS inform

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