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yav cmm motlh Measurement (CHA') je jojDaq Difference

nano (xi'an) Metrology co., Ltd | Updated: Oct 17, 2016
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actual amount factors yoqvaD elements 'aD maqochpu'na' maHtaH position Qagh. Hoch tu'lu'bej Qagh je ghaj 'ay' actual benchmark, vaj benchmark elements neH conventional measurement, baS motlh ghor lo' je yap tu'lu'bej simulate nIS 'oH.

lo'lu'DI''aD HablI' Quv wej, puS Quv lang Qap-'ay' 'aD neH nIS maH vaj laH SIm Don Qagh De'wI'. wuv precision 'aD cmm accuracy, pagh vay' Data'nISbogh je artifacts Daq, vaj waH latlh close to actual ghu' 'ay' ghaj.

laH wav ghor measurement vaj bIquv cha': wa' 'aD nger vISov ghor tu'lu'bej, vaj actual ghor, qaStaHvIS ngoD Qagh ghor qoghDu'DajDaq; curved, 'aD pIj poQ 'oH chov latlh nger curve ghor tu'lu'bej nger ghor according to actual 'aD De', ghoghmey Sovbe'lu'bogh Qoylu',. rewbe'mey'e' lo' conventional method wa'DIch bIquv measurement.

during measurement mIw pong cmm lo', neH nIS waH workbench, lugh positioning 'ej alignment, 'ay' lan puS lang qaStaHvIS manual measurement mode 'aD je 'aD ghot'e' je theoretical contour compare maH.

wej neH vIvup repeatability 'ach 'eS 'aD efficiency muSujmo' conventional 'aD method wej Quv 'aD HablI' Qatlh vI'Iprup batlh Savan puS je tu'lu'bej geometry size laH 'aD conventional 'aD jan 'ach 'oH DeSDu' poH rap. pa' position Qagh measurement, chach jan simulation benchmark lo' ghewmey nIS maH. nep tlhejmeH cmmjen 'aD accuracy'ej efficiency 'aD, baS ghob'e' qaStaHvIS laHlIj waH manufacturing.


DubelmoHchugh maHvaD inform vaj quesrions qeS pagh vay'

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