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measurement cham ghaH Integral lopno' Manufacturing mIw

nano (xi'an) Metrology co., Ltd | Updated: Feb 06, 2017
Source:

nom pIq, ralqu'nIStaH nom adopt 'oH'aD tool waH,'ej qawlu' vuS characteristic ngaQHa'moHwI'mey waH, ralqu'nIStaH comprehensive measurement laH je much 'oH.

qaStaHvIS nuq 'oH, nap3d measurementQay wanI'vammo' tlha' Qap-vIrurqu'law'. 'ej refer, 'ej 'oH Hoch pagh law' mIw manufacturing mIw.

automatically

vaj ideal measurement cham:

1. Hoch imperfections catch;

2. modify manufacturing mIw neH real poH.

vaj, laHlIj SeH vu'wI' ngoy' 'aD technique rar je production mIw mIw manufacturing automatically correction lulIngmeH.

chu' qaD qab laHlIj SeH vu'wI':

1. Hoch pat integrate;

2. vu' Sar arithmetic lIS 'ej pa' real poH modify.

flexible

nom pIq, measurement cham ghaH nobmeH:

1. imperfection Segh vay' ghov;

2. DuHIvDI' vI'Iprup flexible taS 'aD

vaj, bIraqlul inspection, regardless of size, complexity je Hap 'u' vu' nIS laHlIj SeH vu'wI'.

chu' qaD qab laHlIj SeH vu'wI':

1. maHvaD motlhjaj ghu'vam Huj automation pat;

2. vI'Iprup flexible 'aD pat adopt.


DubelmoHchugh maHvaD yu' 'ej QuQ vIvoqHa' pagh qeS inform

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